AI-Driven JTAG Log Monitoring System for FPGA

The FPGA and ASIC debugging, boundary scan testing, and device coding owe vivid gratitude to JTAG Interfaces (Joint Test Action Group format adhering largely to IEEE 1149.1 standards). In this paper, we experiment with an AI-based method for JTAG log monitoring and performance trend forecasting. Using deep learning models such as LSTMs and Transformers, the system can find deviations from log patterns and predict potential failures in advance. This kind of closed-loop analysis enhances our reliability to unprecedented levels. The system described in this work is made for hybrid cloud deployment, providing secure, scalable, and real-time log analysis software. The paper further discusses the architectural integration of AI into existing JTAG frameworks for FPGAs and RISC-V ASICs, detailing security considerations, implementation challenges, and potential industry applications. This paper is based on a patent: AI-Driven Hybrid Cloud JTAG Log Monitoring System for FPGA Debugging and Failure Prediction (Patent Number 63/771,667).