Atomic modeling of radiation damage in cryoelectron microscopy datasets

Damage to biological specimens by the electron beam is the fundamental resolution-limiting factor in cryoelectron microscopy (cryo-EM) single particle analysis. There is, however, currently no method to accurately infer fluence-dependent changes to the specimen structure during electron irradiation. We develop a Bayesian framework to fit a sequence of atomic models to a series of cryo-EM reconstructions produced at increasing fluence. In particular, our algorithm is able to infer the ensemble average position and atomic displacement parameter of every atom in the macromolecule as a function of fluence. Application of the algorithm to cryo-EM datasets shows that the molecule expands during imaging and identifies environment-dependent variations in beam-induced damage. We use our results to propose a stochastic process model of this phenomenon. We envisage that our method will lead to a better mechanistic understanding of radiation damage to biological specimens and may contribute to efforts to mitigate its effects.