Size-Dependent Bending and Buckling Analysis of Piezoelectric Semiconductor Nanobeam Based on Two-Phase Local/Nonlocal Integral Models

In this paper, the size-dependent bending and buckling behaviors of a piezoelectric semiconductor nanobeam are investigated using both strain-driven and stress-driven two-phase local/nonlocal integral models. The governing equations are derived based on a linearized one-dimensional phenomenological theory of piezoelectric semiconductors. The two-phase local/nonlocal integral formulation is implemented, and the integral equations are transformed into differential forms with corresponding constitutive constraints. Several dimensionless variables are introduced to simplify the formulations. The general differential quadrature method is employed to obtain numerical solutions. Based on the results, the influence of nonlocal parameters on the bending deflection, electric potential, and buckling loads of the piezoelectric semiconductor nanobeam is examined under various boundary and loading conditions. Critical comparisons between strain-driven and stress-driven modeling paradigms are highlighted to elucidate their distinct predictive capabilities in nanoscale electromechanical coupling phenomena.