Study of the structural and optical properties of thin films of copper sulfide with different thicknesses prepared by pulsed laser deposition technique.

The unique properties of copper sulfide, particularly in the field of photovoltaic applications, have prompted an investigation. This practical research study of the compound includes structural and optical examinations. We prepared and deposited four thin films on glass slides using the pulsed laser deposition technique (PLD). The XRD data indicate that the films are polycrystalline and exhibit a hexagonal crystalline structure compared to the standard international diffraction cards. We conducted and analysed optical property tests over wavelengths ranging from (100–900) nm. The analysis results and graphs showed that the absorbance went up as the film thickness went up or as the number of laser pulses used to make the films went up. However, transmittance decreased as film thickness increased, unlike absorbance. The bandgap energy was calculated, and through mathematical calculations, it was found to be of the allowed direct type, with values ranging from 2.1eV to 2.4eV.