Noise Measurement in Second Harmonic Generation with Quasi – Phase - Matching Device for Electric Poling Quality Evaluation

The fabrication of quasi phase matching (QPM) device contains error in domain width. In the fabrication of QPM devices, one of the main contributors to this error in domain width is the electric poling process. This domain width error affects both the effectiveness of non – phase - matched parasitic processes and the effectiveness of frequency conversion, which frequently affects the performance of the QPM devices. In this paper, we proposed another methods to evaluate the electric poling quality of QPM through second harmonic generation (SHG) - noise intensity distribution, which is basically noise given the understanding of the error in the domain width in QPM. For measuring the error in domain width of a QPM device and offering a practical approach for evaluating the quality of the electric poling of a QPM device as good or poor.