Nonlinear Heisenberg Limit via Uncertainty Principle in Quantum Metrology

The Heisenberg limit is acknowledged as the ultimate precision limit for parameter estimation in quantum metrology. Recent studies have demonstrated super-Heisenberg-scaling limits, where the root mean square errors of estimation decrease faster-than-linearly with the number of probes or evolution processes. This casts doubt on what the ultimate precision limit of quantum metrology really is and, in particular, whether there is a deeper connection with Heisenberg's uncertainty principle. By linking the dynamics of the metrological process with properties in parameter space, we construct a Heisenberg's uncertainty relation between the unknown parameter and its canonical momentum. We propose a novel quantum metrological scheme that utilizes a generating process with indefinite time direction to increase the canonical momentum nonlinearly. This approach achieves a nonlinear-scaling precision limit that improves quadratically with the increase in evolution time length or the number of processes, in accordance with Heisenberg's uncertainty relation. Then we experimentally demonstrate in quantum optical systems that this nonlinear-scaling enhancement can be achieved with a fixed amount of energy in the probes. Consequently, our results provide a deeper insight into the Heisenberg limit in quantum metrology, and shed new light on improving the precision of practical metrological and sensing tasks in realistic quantum systems.