Modelling Metrological Traceability

Metrological traceability is essential for ensuring the accuracy of measurement results and enabling comparison of results to support critical decision-making in society. This paper explores a structured approach to modelling traceability chains, focusing on the role of residual measurement errors and their impact on measurement accuracy. This work emphasises a scientific description of these errors as physical quantities. By adopting a simple, static modelling framework grounded in physical principles, the paper offers a formal way to track the effects of errors through an entire traceability chain, from primary reference standards to end users. Real-world examples from microwave and optical metrology highlight the effectiveness of this rigorous modelling approach. Additionally, to further advance digital systems development in metrology, the paper advocates a formal semantic structure for modelling, based on principles of Model-Driven Architecture. This architectural approach will enhance the clarity of metrological practices and support ongoing efforts toward the digital transformation of international metrology infrastructure.