Correcting Non-Uniform Milling in FIB-SEM Images with Unsupervised Cross-Plane Image-to-Image Translation
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Motivation
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) is an advanced Volume Electron Microscopy technology with growing applications, featuring thinner sectioning compared to other Volume Electron Microscopes. Such axial resolution is crucial for accurate segmentation and reconstruction of fine structures in biological tissues. However, in reality, the milling thickness is not always uniform across the sample surface, resulting in the axial plane looking distorted. Existing image processing approaches often: (i) assume constant section thickness; (ii) consist of multiple separate processing steps (i.e., not in an end-to-end fashion); (iii) require ground truth images for modeling, which may entail significant labor and be unsuitable for rapid analysis.
Results
We develop a deep learning method to correct non-uniform milling artifacts observed in FIB-SEM images. The proposed method is an image-to-image translation technique that can mitigate image distortions in an unsupervised manner. It conducts cross-plane learning within 3D image volumes without any ground truth annotations. We demonstrate the efficacy of our method on a real-world micro-wasp dataset, showcasing significantly improved image quality after correction with qualitative and quantitative analysis.
Contact
pfister@seas.harvard.edu , jingpengw@lglab.ac.cn
